Withdraw the specimen exchange rod all the way out. This tool excels in lightning fast data acquisition through simple and automated operation. The highprecision electron optical system incorporated in this sem is effectively used with the large flexible specimen chamber that accommodates a 200mm diameter specimen. Explore our range of intouchscope sems, field emission sems, multibeam fib sems, and our benchtop sem. On tem spot1, alpha3 xyz0, tx0, ty0 double click stage neutral to return all coordinates to 0 beam valve. Jsm7610f is an ultra high resolution schottky field emission scanning electron microscope which has semiinlens objective lens. The jeol jsm7610fplus field emission sem combines two proven technologies. The jed2300, eds developed by jeol, is embedded in the compact sems. Jem 2100 manual operation and basic alignment instructions 1. Burn your files onto a provided cd, delete your files.
The jsm 6700f is able to handle samples up to 8 inches in diameter. Turn on the scanning image observation instrument with the ope power switch at the rear of the instrument. Jeol 7000 fe scanning electron microscope ua analytical. Check sem status under the maintenance gunvac gun and write down the. The jsm6700f is able to handle samples up to 8 inches in diameter. Basic knowledge for using the sem since the scanning electron microscope sem was first commercialized about 40 years ago, the sem has shown a remarkable progress.
The sem and eds are operated as one seamless system to provide comfortable and efficient operation. Use the standard procedure for sample preparation and put the sample into the holder. Its also suitable for high spatial resolution analysis. Jeol 6700f sem that has capabilities for energy dispersive spectroscopy eds to perform elemental analysis.
It is equipped with a secondary electron detector for topographic contrast imaging, a retractable backscattered electron detector for atomic number contrast imaging and an oxford inca edx system for compositional analysis. Jeol provides valuable applications support, comprehensive training, and awardwinning service for the long lifetime of our instruments. The jsm7900f is equipped with a large specimen chamber that accommodates a wide variety of detectors simultaneously. If not logged in, log in to the user accounts on the jeol and gatan computers. Insert the specimen exchange rod and turn the knob to the left. Sem jeol, jsm6301 operation manual 2014 06 11 the turning. Sem jsm7600f quick operating instruction manual important be careful not to let the air inside the chamber when inserting the sample using the exchange rod turbo pump can be damaged. Use keyboard and mouse lying on top of gatan computer to log into that computer. It is a topoftheline sem for semiconductors, nanotechnology, material science. Obtaining an image 1 wait until the chamber vacuum is at 5x10 4 pa or lower. S c a n n i n g introduction he jeol jsm6060lv is a stateoftheart scanning electron microscope that features a low vacuum for observation of nonconductive specimens, a fully automated electron gun, a backscattered electron detector for atomic number contrast imaging, fully integrated digital control, motorized xy stage, and a noran system. The system can be operated in variable pressure mode air to reduce charging or image nonconductive specimens. Jc m 6 0 p l u s n e o s c o p e b e n c h t o p s e m jcm6000plus.
When the electron beam is turned on, some xrays are. Click the button and read the penning gauge to ensure that the microscope is at appropriate vacuum 104 105 pa. With a pin or any sharp object, carefully open the clamp 5 of the specimen holder and insert the grid with the sample. Verify the vacuum in jeol pc temcon valve status window vacuum system guncamera valves v1 and v2 off black pirani gauge status pig2 user or gang lianggang. The jsm7900f field emission sem is a uniquely flexible platform that combines the ultimate in high resolution imaging with unparalleled nano scale microanalysis. Log in to your session on the computer to the left of the microscope. Jeol ltd jsm6700f scanning electron microscope sold lot. Basic stepbystep instructions for jeol 6060lv version 411 general operation 1. This manual contains information regarding the basic operation of this microscope for conventional imaging.
If your specimen needs to protrude above the cylinders top face or the top face of another holder, you can. Jeol jsm 6460 scanning electron microscope sem with oxford inca energy eds system and mics microscope image capture system is a highperformance versatile sem. Move lens power supply switch to on and accelerating voltageswitch to operate. Jeol jem 2010 training transmission electron microscope user manual version 5. Scanning electron microscope 6 pages summary of contents for jeol jem2100f page 1 instructions jem2100f field emission electron microscope for the proper use of the instrument, be sure to read this instruction manual. The graphic user interface figure 4 the jeol 2500se gui. This document is an introduction to the operation of the jeol 5800lv scanning electron microscope and the oxford isis 300 analytical system.
Like a true generalpurpose sem system, jsm7500f can provide highresolution imaging of large specimens gentle beam gb provides topsurface imaging with ultralow energy incident electrons a gentle beam gb mode with better resolution than the normal mode is available. Operating procedure for jeol 7600f high resolution analytical sem. Here you can find nuclear magnetic resonance tutorials to suit you need. The jsm6700f is a super intelligent pc sem assuring compatibility with future computer technologies. Basic operation ppt exploring the jeol program ppt intro to oxford edx ppt oxford channel 5 user manual pdf related links. The jsm6700f is a high resolution sem with a field emission gun feg electron source. Its unique graphical user interface controls condition setup, motor stage drive, imaging, and data filing, assuring stable and reliable operation. After this, the computers should be controllable by jeol mouse and keyboard. Jsm7600f schottky field emission scanning electron microscope. Operating procedure for jeol 7600f high resolution. Check sem status under the maintenance gunvac gun and write down the sip1pa and sip2 pa pressure on your log in sheet. If vacuum is not good enough, contact somebody from the lme staff. Set the specimen on the specimen support, and adjust the specimen support so that the top.
Jeol has played a leading role in the development and evolution of scanning electron microscopes since the early 1960s. The information contained in this manual is subject to change without notice. Jeol usa scanning electron microscopes sem jeol usa inc. If the previous user has left the probe in an overnight run, you will need to enter your password to activate the screen. Intuitive operation is achieved via touch panel and new operation screens. High power optics can provide high throughput and high performance analysis. Press ctrlaltdel and log on to the microscope computer. The jsm7900f is equipped with a large specimen chamber that accommodates a wide variety of detectors simultaneously, including. Jeol jsm6060lv scanning electron microscope is userfriendly and easy to operate. Under the initialize menu in the epma main menu, select logout. User guide jeol jsm6300 scanning electron microscope compiled by sam boggs, with input from john donovan, ricky gasser, and ben klusman 1.
Follow the procedures below when you use the jem1400plus. Safety the scanning electron microscope is a relatively safe instrument you can do much more damage to it than it can do to you. Jeol 1200ex instructions analytical imaging facility. Follow the procedures below when you use the jem1400plus tem. Stylish appearance, compact and lightweight allows for installation in small spaces. Pumps running and evac light green main panel near key switch. Scanning electron microscope this is a cold field emitter high resolution sem model. Builtin rfilter enabling user selectable mixture of secondary electron and. The highprecision electron optical system incorporated in this sem is effectively used with the large flexible specimen chamber that accommodates a 200mm diameter speci.
Jeol 7600f high resolution analytical sem operating procedure v. Open the gun isolation valve by clicking the on button under observation. Sem jsm 5800 quick operating instruction manual starting position control unit. The jsm5600 is a conventional sem with a tungsten filament electron source. Rotate the power key switch to the start position, and release the hand from the key. Jsm7500f field emission scanning electron microscope.
Jeol is a world leader in electron optical equipment and instrumentation for highend scientific and industrial research and development. Scanning electron microscope materials characterization and. The jsm 6700f is a high resolution sem with a field emission gun feg electron source. Scanning electron microscope materials characterization. This manual was written for all three us geological survey microprobe laboratories and is intended to be an overall users guide to the operation of a jeol 8900 series superprobe. This manual should be considered a work in progress. It is equipped with a secondary electron detector for topographic contrast imaging and an oxford inca edx system for compositional analysis.
The specimen exchange procedure is presented in a flow format, so that the process can be easily completed even by a first time user. Jeol jsm6060lv operating instructions manual pdf download. If you leave files, they will be deleted after a month. Jeol jsm 6460 scanning electron microscope sem jeol jsm. This manual was written for all three us geological survey microprobe laboratories and is intended to be an overall user s guide to the operation of a jeol 8900 series superprobe.
The low vacuum mode is included in the standard configuration, and eds can be installed, offering a truly multifunctional benchtop sem. If you are the first user of the day, take out acd heater, fill the anticontamination device acd with ln. These are the only procedures you should carry out, unless you have received specific additional training. We will have to use some of your beam time 510 mins. Standard operating procedure for the jeol jsm840a sem the nebraska center for materials and nanoscience central facility for electron microscopy 12c walter scott engineering center university of nebraska lincoln, nebraska this work is intended a guide to the operation of the jsm840a sem by the average user. Select a user name from the user list, and click the. The jeol jsm6010 is a tungsten cathode scanning electron microscope equipped with secondary, backscattered and secondary electron detectors, cathode luminescence and edx detector. Basic sem unit the jsm6300 basic unit fig 1 consists of an electron optical column mounted on the main console, a control and display system, a power supply unit, and a pump box. Select ok, wait for the login screen and then enter your code and password. Login proceeds automatically, displaying the epma main menu on the monitor. Operation via touch panel simplifies execution from observation to analysis. Once training begins, you may request access to the room from gang liang. Jcm6000plus is a fullfledged benchtop sem with versatile functions. Click yes if message on screen about stage appears.
Lab facilities and training scanning electron microscope. This is a very minimal operation checklist and does not replace the other reference manuals. Jeol innovations in resolution and functionality enable the microscopist to better image. Oxford instruments inca tips some useful tips when using the oxford inca system. April 8, 2020 by jeol usa scanning electron microscope sem 0 comment read more scanning electron microscope a to z. If the sem software is not running, start sem software sem main menu icon. Sem jeol, jsm6301 operation manual 2014 06 11 the turning on the sem 1. Open the program and log in with your user name and password. With time, we will add sections as operating procedures are developed or improved by user experience. Standard operating procedure for the jeol jsm840a sem. Shutdown click beam current off leave magnification at 5000 use specimen position monitor to position holder in center remove holder using proper procedure log out of tem computer camera computer. Verify the vacuum in jeol pc temcon valve status window vacuum system guncamera valves v1 and v2 off black pirani gauge status pig2 wanted.